ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis, November 11-15, Santa Clara, California by ASM International
ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis, November 11-15, Santa Clara, California by ASM International PDF, ePub eBook D0wnl0ad
Proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format. Contents include: Advanced techniques Packaging Backside analysis Scanning probe microscopy Focused ion beam (FIB) techniques Failure analysis of micro-electromechanical systems (MEMS) Yield improvement Discretes Defect-based testing Case histories.From reader reviews:
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